Webinar The developments in NXTGEN Semicon 04 & Semicon 08
This project focuses on the development of advanced metrology systems to accelerate and improve high-tech processes such as the fabrication of integrated circuits and precision diagnostics of biological tissues. The emphasis is on integrating systems for parallel data acquisition, which requires the processing and storage of large data streams. The project aims to automate and optimize workflows in laboratory and production environments to increase efficiency. Key areas include the development of faster and more accurate metrology systems, the creation of optimized workflows, and the enhancement of data analysis techniques to derive actionable insights from complex datasets.
More about the Semicon 08 project:
Within this project, two machines are being developed for testing integrated photonic chips. The goal is for the consortium to become a global leader in visual and prober test equipment for integrated photonics. To achieve this, three generations of machines will be developed, transforming fundamental research into functional machines.
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