This year’s edition of ‘TNO Semicon Innovation Day’ will be organized as an online event. You are welcome to participate in two sessions during the Dutch Technology Week.

• 10:00 – 12:00 [session A] Ultra clean design and defectivity control
• 15:00 – 17:00 [session B] New inspection and metrology technologies

These webinars will bring together technology leaders from the major Dutch industry players and research institutes to discuss challenges, emerging solutions, and needed innovations for contamination control and semiconductor metrology.

Register for [Session A] Ultra clean design and defectivity control

Register for [Session B] New inspection and metrology technologies

Full programme & additional information